Scanning electron microscopes MultiSEM 505/506

ZEISS MultiSEM 505/506​ The World’s Fastest Scanning Electron Microscopes

Unleash the acquisition speed of up to 91 parallel electron beams – to image samples in the centimeter scale at nanometer resolution. This unique scanning electron microscope is designed for continuous, reliable 24/7 operation. Simply set up your high-throughput data acquisition workflow and MultiSEM will acquire high-contrast images automatically.

• Unprecedented imaging speed
• ​​Automated large-area image acquisition
• Nanoscale details in the macroscopic context
• High-contrast images at low noise levels

Revolutionize the Speed of Electron Microscopy

Multiple electron beams working in parallel give you unprecedented gross imaging speed. Acquiring an area of 1 mm2 at 4 nm pixel size takes only a few minutes. The unrivaled acquisition speed of more than 1 TB per hour enables imaging of large volumes (> 1 mm3) at nanometer resolution. Optimized detectors collect the secondary electron signals very efficiently, providing you with high contrast images at low noise levels.Caption: Mouse brain section, maximum acquisition speed of 1.22 gigapixels/second. Courtesy of J. Lichtman, Harvard University, Cambridge, MA, USA.

Image Huge Samples at Nanometer Resolution

Don’t sacrifice sample size for nanometer resolution. MultiSEM is equipped with a sample holder covering an area of 10 cm × 10 cm and built for continuous 24/7 operation. You can finally image the entire sample and discover everything you need to answer your scientific questions. You get the detailed picture‚ without losing the macroscopic context.

Electron Microscopy with ZEN Imaging Software

By introducing ZEN to MultiSEM, we bring the standard software for ZEISS light microscopes to the world of electron microscopy. Control MultiSEM in a straightforward, intuitive way: Smart auto-tuning routines support you as you capture optimal images with high resolution and quality. You quickly set up even complex automated acquisition procedures, adapted and tuned to your sample imaging.

The ZEISS MultiSEM Family​

The Technology Behind ZEISS MultiSEM​

Multiple Electron Beams and Detectors in Parallel​

MultiSEM uses multiple electron beams (green: illumination path) and detectors in parallel. A finely tuned detection path (red) collects a large yield of secondary electrons (SE) for imaging. Each beam carries out a synchronized scanning routine at one sample position, resulting in a single sub image. The electron beams are arranged in a hexagonal pattern. The full image is formed by merging all image tiles. A parallel computer setup is used for fast data recording, ensuring high total imaging speed. Image acquisition and workflow control are fully separated in the MultiSEM system.

ZEISS MultiSEM at Work​