Scanning Electron Microscopes SEM and FIB-SEM
Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
CSEMs (conventional SEMs with a thermic electron source) and FE-SEMs (field emission SEMs with a field emission electron source) from ZEISS deliver high resolution imaging and superior materials contrast.
● High resolution surface sensitive information and materials contrast.
● Widely used in nanotechnology, materials research, life sciences, semiconductor, raw materials and industry.